Journal
CARBON
Volume 41, Issue 3, Pages 563-570Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0008-6223(02)00359-7
Keywords
carbon fibers; X-ray diffraction; elastic properties; microstructure; lattice constant
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The in-plane Young's modulus and the shear modulus of carbon nanocrystallites were investigated during in-situ tension tests of single carbon fibers by X-ray diffraction using the shift of the 10 band in the meridional direction and the change in the azimuthal width of the 002 reflection. The limiting value for the Young's modulus was found to be 1140 GPa, which is higher than the value for graphite obtained from macroscopic specimens, but coincides with recent measurements on nanotubes. Furthermore, the shear modulus was evaluated using a uniform stress approach and was found to increase with increasing misorientation of the crystallites. It turns out that both the in-plane Young's modulus and the shear modulus are not constant, but dependent on the orientation parameter. (C) 2002 Elsevier Science Ltd. All rights reserved.
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