Journal
IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume 38, Issue 12, Pages 2040-2050Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2003.819167
Keywords
analog-to-digital conversion; adaptive systems; calibration; CMOS analog integrated circuits; linearization techniques; parameter estimation
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Precision amplifiers dominate the power dissipation in most high-speed pipelined-analog-to-digital converters (ADCs). We propose a digital background calibration technique as an enabling element to replace precision amplifiers by simple power-efficient open-loop stages. In the multibit first stage of a 12-bit 75-MSamples/s proof-of-concept prototype, we achieve more than 60% residue amplifier power savings over a conventional implementation. The ADC has been fabricated in a 0.35-mum double-poly quadruple-metal CMOS technology and achieves typical differential and integral nonlinearity within 0.5 LSB and 0.9 LSB, respectively. At Nyquist input frequencies, the measured signal-to-noise ratio is 67 dB and the total harmonic distortion is -74 dB. The IC consumes 290 mW at 3 V and occupies 7.9 mm(2).
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