An experimental study of millimeter wave absorption in thin metal films

Optical characteristics (R, T, A) of thin aluminum films with thicknesses from 1.7 to 15 nm were studied at a wavelength of 8 mm with allowance for a substrate material. The absorption exhibits a maximum for a film thickness of 2.5 nm. The experimental data are interpreted taking into account the dependence of electric conductivity on film thickness. (C) 2003 MAIK Nauka/Interperiodica.