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Glow discharge optical emission spectrometry: moving towards reliable thin film analysis - a short review

Journal

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
Volume 18, Issue 6, Pages 670-679

Publisher

ROYAL SOC CHEMISTRY
DOI: 10.1039/b301293j

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Glow discharge optical emission spectroscopy (GD-OES) is briefly reviewed, with particular reference to topics relevant to the application field of near surface and thin film analysis. The special needs and requirements for thin film analysis, in contrast to coating and bulk analysis, are pointed out. A task list is developed which shows the requirements of further developments to the technique and the fundamentals. The state-of-the-art is presented in measurement technique, GD source control and design, the effect of traces of molecular gases, correction and quantification procedures, contributions of modelling and, finally, reference materials for thin film analysis.

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