Journal
PROCEEDINGS OF THE IEEE
Volume 91, Issue 11, Pages 1934-1939Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPROC.2003.818324
Keywords
closely pocked devices; device scaling limits; digital integrated circuits; heat removal; nanotechnology; power consumption; tunneling
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In this paper we consider device scaling and speed limitations on irreversible von Neumann computing,that arc derived from the requirement of least energy computation. We consider computational systems whose material realizations utilize electrons and energy barriers to represent and manipulate their binary representations of state.
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