Journal
ULTRAMICROSCOPY
Volume 98, Issue 2-4, Pages 187-193Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2003.08.025
Keywords
electron diffraction; 3D reconstruction; unit-cell determination; image processing
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A program system-Trice-for reconstructing the 3D reciprocal lattice from an electron diffraction tilt series is described. The unit-cell parameters can be determined from electron diffraction patterns directly by Trice. The unit cell can be checked and the lattice type and crystal system can be determined from the 3D reciprocal lattice. Trice can be applied to all crystal systems and lattice types. (C) 2003 Elsevier B.V. All rights reserved.
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