Journal
IEEE TRANSACTIONS ON MAGNETICS
Volume 40, Issue 1, Pages 319-325Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMAG.2003.821163
Keywords
bit-aspect ratio (BAR); effective write field; finite-element model (FEM); micromagnetic model; neighborhood induced transition shift (NITS); perpendicular recording; side shields; signal-to-noise ratio (SNR); soft underlayer (SUL); Tb/in(2); thermal erase width; transition jitter; transition shift; writability; write width
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We have revisited the considerations of perpendicular recording at 1 Tb/in(2). We have extensively modeled head designs with the down-track shield (DS) and head designs with the down-track and side shields (DS-SS). The side shields are needed to reduce the thermal erase width, however, there is a substantial reduction in effective write field for the DS-SS heads compared to the DS heads. This reduction in effective write field defines an upper limit for the anisotropy of the medium that can be written. As a consequence, it is hard to simultaneously achieve writability and the thermal stability requirement for 1 Tb/in(2).
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