Journal
FERROELECTRICS
Volume 313, Issue -, Pages 7-13Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/00150190490891157
Keywords
thin-film ferroelectrics; coercive field; thickness-scaling
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Motivated by the observed thickness-scaling of the coercive field in ferroelectric films over five decades, we develop a statistical approach towards understanding the conceptual underpinnings of this behavior. Here the scaling exponent is determined by the field-dependence of a known and measured quantity, the nucleation rate per unit area. We end with a discussion of our initial assumptions and point to instances where they could no longer be applicable.
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