Journal
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
Volume 24, Issue 6, Pages 1579-1583Publisher
ELSEVIER SCI LTD
DOI: 10.1016/S0955-2219(03)00407-2
Keywords
electron microscopy; films; grain size; microstructure-final; PZT
Categories
Ask authors/readers for more resources
PZT thin films are commonly used for piezoelectric sensors and actuators. Some applications require a film thickness of a few micrometers, which can be achieved by using a sol-gel process with several coating and annealing steps. We prepared sol-gel derived Nd-doped and undoped PZT (53/47) films on metallic substrates by various thermal annealing treatments. During the pyrolysis and the annealing process, a Zr:Ti fluctuation along the cross-section of the sol-gel films takes place. By means of transmission electron microscopy (TEM), electron diffraction and energy dispersive X-ray spectroscopy (EDX), the local Zr:Ti ratio..,and phase-content have been estimated indicating a decreasing tetragonal distortion, especially for layers close to the substrate. These results are related to the microstructure of the films, taking into account the tensions resulting from the difference in the thermal expansion of the metallic substrate to the ceramic film and the crystallite size. (C) 2003 Elsevier Ltd. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available