Journal
FERROELECTRICS
Volume 303, Issue -, Pages 101-105Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/00150190490452857
Keywords
Raman spectroscopy; soft mode; thin films
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A comparative Raman study of (Ba,Sr)TO3 bulk ceramics, sol-gel derived polycrystalline thin film, and heteroepitaxial thin film deposited by rf sputtering onto (001) MgO substrate is reported. It is found that phase transition sequence in the heteroepitaxial thin film is markedly different from those observed in the bulk ceramics and polycrystalline thin film.
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