Journal
INTERNATIONAL JOURNAL OF PLASTICITY
Volume 21, Issue 4, Pages 759-775Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ijplas.2004.04.013
Keywords
transmission electron microscopy; image contrast simulation; dislocations; shockley partials; grain boundary; DSC lattice
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A complex dislocation configuration resulting from the interactions between dissociated lattice dislocations and a Sigma = 3 grain boundary is analyzed in pure copper, on the basis of transmission electron microscopy observations coupled with image contrast simulation. The paper focuses on the different mechanisms which may operate to allow the entrance of the Shockley partial dislocations within the grain boundary. (C) 2004 Elsevier Ltd. All rights reserved.
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