Journal
MICRON
Volume 36, Issue 2, Pages 185-189Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.micron.2004.11.001
Keywords
EELS; TEM; monochromator; energy resolution; bandgap
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The practical advantages of a monochromator for electron energy-loss spectroscopy (EELS) in transmission electron microscopy are reviewed. The zero-loss peaks (ZLPs) of a monochromator and a cold field emission gun are compared in terms of bandgap measurement performance. The intensity of the ZLP tails at the bandgap energy is more important than the full-width at half maximum of the ZLP, and a monochromator is preferable to conventional electron sources. The silicon bandgap of 1.1 eV is evaluated from the onset in the EEL spectrum obtained using the monochromator without a numerical procedure. We also show a high-speed instability-correction technique to realize the inherent energy resolution of the monochromator, in which instabilities of less than 335 Hz are corrected using 512 EEL spectra obtained with an exposure time of 1.4 ms. It will be useful in bandgap measurements and advanced studies for elucidating sub-eV EEL spectra. (C) 2004 Elsevier Ltd. All rights reserved.
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