Journal
INTERNATIONAL JOURNAL OF PLASTICITY
Volume 21, Issue 2, Pages 381-395Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ijplas.2004.01.004
Keywords
void size effect; Gurson model; Taylor dislocation model; spherical microvoid; yield condition
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The Gurson model [J. Engrg. Mater. Technol. 99 (1977) 2] has been widely used to study the deformation and failure of metallic materials containing microvoids. The void volume fraction is the only parameter representing voids since the void size does not come into play in the Gurson model. Based on the Taylor dislocation model [Proc. R. Soc. (Lond.) A145 (1934) 362-1 J. Int. Metals 62 (1938) 307], we extend the Gurson model to account for the void size effect. It is shown that the yield surfaces for micron- and submicron-sized voids are significantly larger than that given by the Gurson model. For a voided, dilating material subject to uniaxial tension, the void size has essentially no effect on the stress-strain curve at small initial void volume fraction. However, as the initial void volume fraction increases, the void size effect may become significant. (C) 2004 Elsevier Ltd. All rights reserved.
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