4.5 Article

High-speed resonant cavity enhanced Ge photodetectors on reflecting Si substrates for 1550-nm operation

Journal

IEEE PHOTONICS TECHNOLOGY LETTERS
Volume 17, Issue 1, Pages 175-177

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LPT.2004.836917

Keywords

Germanium (Ge); photodetectors; resonant cavity enhanced (RCE); silicon-on-insulator (SOI)

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We have designed and fabricated high-speed resonant cavity enhanced germanium (Ge) Schottky photodetectors on a silicon-on-insulator substrate. These back-illuminated detectors have demonstrated 3-dB bandwidths of more than 12 GHz at 3-V reverse bias and a peak quantum efficiency of 59% (R = 0.73 A/W) at the resonant wavelength of similar to1540 nm. Time domain measurements of our Ge photodetectors with diameters of up to 48 mum show transit-time limited impulse responses corresponding to bandwidths of at least 6.7 GHz, making these detectors compatible with 10-Gb/s data communication systems.

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