Journal
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
Volume 44, Issue 16-19, Pages L561-L563Publisher
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.44.L561
Keywords
bismuth iron oxide; chemical solution deposition; thin film; rare earth; ferroelectric property
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Ion modification techniques for improving the insulating and ferroelectric properties of BiFeO3 (13170) thin films are reported. Rare-earth-substituted BFO films with chemical compositions of Bi1.00-xRExFe1.00O3 [RE = La and Nd] were fabricated on (111)Pt/TiO2/SiO2/(100)Si substrates using a chemical solution deposition technique. Well-saturated P-E curves were obtained for La3+ and Nd3+-substituted BFO films, while the curve of a nonsubstituted BFO film was distorted due to the leakage current. Remanent polarization (P-r) values measured at 10 K were respectively 44 and 51 mu C/cm(2), for La3+- and Nd3+-substituted BFO films, which are significantly superior to conventional Pb-free ferroelectrics.
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