Journal
CIRP ANNALS-MANUFACTURING TECHNOLOGY
Volume 55, Issue 1, Pages 75-80Publisher
ELSEVIER
DOI: 10.1016/S0007-8506(07)60370-9
Keywords
chip form monitoring; cutting force sensor; advanced signal processing
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This paper draws on the activities of the CIRP Collaborative Work on Round Robin on Chip Form Monitoring carried out within the Scientific-Technical Committee Cutting (STC-C). This collaborative work involved the following main round robin activities: (a) generation, detection, storage and exchange of cutting force sensor signals obtained at different Laboratories during sensor-based monitoring of machining processes with variable cutting conditions yielding diverse chip forms, and (b) cutting force signal (CFS) characterization and feature extraction through advanced processing methodologies, both aimed at comparing chip form monitoring results achieved on the basis of innovative analysis paradigms.
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