Surface studies on the ionic liquid 1-ethyl-3-methylimidazolium ethylsulfate using X-ray photoelectron spectroscopy (XPS)

Surface studies of ionic liquids are particularly important for all kinds of multiphasic operations employing ionic liquids, e.g. biphasic homogeneous catalysis or supported ionic liquid phase catalysis. Using X-ray photoelectron spectroscopy (XPS), the surface composition of the model system 1-ethyl-3-methylimidazolium ethylsulfate [EMIM][EtOSO3] was investigated. By comparing two different samples of this ionic liquid from two different origins, we observed a decisive influence of silicon containing impurities on composition and structure of the surface. For the case of the impurities containing ionic liquid, our angle-dependent XPS data are in agreement with a model of a surface layer consisting of highly oriented ionic liquid molecules. From a fundamental point of view, our study may be of general relevance for the understanding, of the chemistry of liquid surfaces in general.