Journal
JOURNAL OF APPLIED PHYSICS
Volume 99, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2158127
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The transient response during resistance switching in Ag/Pr0.7Ca0.3MnO3/Pt thin films is investigated by measurements using pulsed voltage biases. Semiconducting Pr0.7Ca0.3MnO3 (PCMO) films sandwiched by Ag and Pt electrodes show nonvolatile resistance switching (two orders of magnitude) as a result of applying pulsed voltage biases, even at room temperature. The transient responses of the voltage across the PCMO for a set (positive) and a reset (negative) pulse application are consistent with the resistance-switching behavior and show quite fast switching (3-100 ns) for the set pulse application, compared with 60-135 ns for the reset pulse application. The large resistance-switching ratio is saturated after a finite transient time, indicating that the carrier filling of the trap sites into PCMO is completed within quite a short time.
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