4.7 Article Proceedings Paper

Fabrication and characterization of an InGaAsp/InP active waveguide optical isolator with 14.7 dB/mm TE mode nonreciprocal attenuation

Journal

JOURNAL OF LIGHTWAVE TECHNOLOGY
Volume 24, Issue 1, Pages 38-43

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JLT.2005.861135

Keywords

Fe; InGaAsP; nonreciprocal loss shift; photonic integrated circuit; semiconductor optical amplifiers; waveguide optical isolator

Ask authors/readers for more resources

The authors have fabricated transverse electric (TE) mode InGaAsP/InP active waveguide optical isolators based on the nonreciprocal loss shift and demonstrated improved TE mode isolation ratio of 14.7 dB/mm with reduced insertion loss at a wavelength of 1550 nm for monolithically integrable optical isolators. The wavelength dependence of the isolation ratio and the propagation loss were also measured. An isolation ratio greater than 10 dB/mm was realized over the entire wavelength range of 1530-1560 nm. These results lead to the monolithic integration of semiconductor waveguide optical isolators with edge-emitting semiconductor lasers and highly functional photonic integrated circuits with many cascaded optical devices.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.7
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available