4.1 Article

Soft X-ray spectromicroscopy and ptychography

Journal

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.elspec.2015.05.013

Keywords

Soft X-ray absorption; STXM; SPEM; XPEEM; TXM; Ptychography

Categories

Funding

  1. Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences Division of the U.S. Department of Energy [DE-AC02-05CH11231]

Ask authors/readers for more resources

Instrumentation and current capabilities of soft X-ray (50-2000 eV) spectromicroscopy are outlined with examples from recently published and some new work. Four common techniques are treated transmission X-ray microscopy (TXM), scanning transmission X-ray microscopy (STXM), X-ray photoemission electron microscopy (XPEEM) and scanning photoemission microscopy (SPEM). I also present a fifth, emerging technique, that of soft X-ray spectro-ptychography which has significantly improved spatial resolution and provides new contrast mechanisms. Perspectives for near future (5-10 years) evolution of soft X-ray spectromicroscopy are outlined based on current trends and instrumentation under development. (C) 2015 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.1
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available