Journal
E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY
Volume 5, Issue -, Pages 94-98Publisher
SURFACE SCI SOC JAPAN
DOI: 10.1380/ejssnt.2007.94
Keywords
Scanning Tunneling Microscopy; Multi Probe; Tip; Tungsten; Electrochemical etching
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Funding
- SENTAN Program (Development of System and Technology for Advanced Measurement and Analysis) of the Japan Science and Technology Agency (JST)
- Japanese Society for the Promotion of Science
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We present a method to prepare tungsten tips for use in multi-tip scanning tunneling microscopes. The motivation behind the development comes from a requirement to make very long and conical-shape tips with controlling the cone angle. The method is based on a combination of a drop-offmethod and dynamic electrochemical etching, in which the tip is continuously and slowly drawn up from the electrolyte during etching. Its reproducibility was confirmed by scanning electron microscopy. Comparison in tip shape between the dynamic and static methods was shown.
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