Journal
APPLIED PHYSICS LETTERS
Volume 90, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2424437
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The authors report the spin diffusion length at 4.2 K in sputtered Ni of l(sf)(Ni)=21 +/- 2 nm, and spin-dependent scattering parameters in Ni and at Ni/Cu interfaces. They have employed current perpendicular to plane giant magnetoresistance in both a traditional and an alternative exchange-biased spin valve geometry that inserts a Ni spoiler layer into a Py/Cu/Py spin valve. Fits to data of A Delta R vs Ni thickness using Valet-Fert theory [Phys. Rev. B 48, 7099 (1993)] show good agreement between fit parameters for both sample geometries.
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