4.6 Article

Inner potential fluctuation in SiC nanowires with modulated interior structure

Journal

MATERIALS LETTERS
Volume 61, Issue 14-15, Pages 3134-3137

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2006.11.011

Keywords

silicon carbide; nanowire; electron holography; electron energy loss spectroscopy

Ask authors/readers for more resources

SiC nanowires with modulation in diameter and interior structure along the growth direction have been fabricated via a self-organized process. The SiC nanowires, the basic structure of which is zincblende-type, contain many bunching stacking faults along the growth direction inhomogeneously. In other words, the SiC nanowires consist of alternate stacks of the perfect crystal and the defective regions. We have found the difference in the values of mean inner potential between the perfect crystal and the defective regions by means of electron holography. (c) 2006 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available