4.5 Article

WSXM: A software for scanning probe microscopy and a tool for nanotechnology

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 78, Issue 1, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.2432410

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In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out. (c) 2007 American Institute of Physics.

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