Influence of CaZrO(3) on dielectric properties and microstructures of BaTiO(3)-based X8R ceramics

The influences of CaZrO(3) on the dielectric properties and microstructures of BaTiO(3) (BT)-based ceramics have been investigated. The experiment results showed that the dielectric constant at room temperature increased with the addition of CaZrO(3) in the range of 0-3.0 mol%, which could be explained by the growth of BT grains. XRD analysis revealed that the tetragonality declined as CaZrO(3) concentration increased. XRD patterns of BT ceramics with different amounts of CaZrO(3) doping were analyzed by a recently developed procedure-materials analysis using diffraction (MAUD), which was based on the Rietveld method combined with Fourier analysis. The results depicted that the high temperature peak of temperature-capacitance characteristics (TCC) was largely dependent on the micro-strain of samples. Furthermore, more CaZrO(3) doping resulted in lower porosity and higher density. It was revealed that proper usage of CaZrO(3) could improve the dielectric properties significantly, which was benefit to develop X8R multi-layer ceramic capacitors.