Journal
CANADIAN JOURNAL OF PLANT SCIENCE
Volume 91, Issue 2, Pages 239-250Publisher
AGRICULTURAL INST CANADA
DOI: 10.4141/CJPS10002
Keywords
Integrated genetic improvement; introgressing resistance; multiple-parent crosses; Phase his vulgaris; pyramiding resistance
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Various insect pests and nematodes cause severe losses (35-100%) globally to the yield and quality of dry and green common bean (Phaseolus vulgaris L.). The objectives of this review are to briefly describe major insect pests and nematodes in the Americas, breeding strategies and methods used, and research progress achieved. We also describe integrated genetic improvement for resistance to multiple insect pests and nematodes and cultivar development. Breeding for resistance to one insect pest or nematode at a time has been practiced in most instances. Backcross, pedigree, and bulk-pedigree breeding methods have been used. Considerable progress has been made in genetics and germplasm enhancement for resistance to bean pod weevil (Apion godmani Wagner), tropical bruchid (Zabrotes subfasciatus Boheman), leafhoppers (Empoasca kraemeri Ross and Moore), and root- knot nematode (Meloidogyne species). However, improvement in resistance to Acanthoscelides obtectus (Say), lesion (Pratylenchus species) and soybean cyst (Heterodera glycines) nematodes, and other regional insect pests has been minimal or non-existent. Furthermore, dry or green common bean cultivars with high levels of resistance to one or more insect pests and nematodes are rare. Breeding strategies for integrated and simultaneous genetic improvement of multiple qualitatively and quantitatively inherited resistances for cultivar development are briefly described.
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