Journal
CANADIAN JOURNAL OF PHYSICS
Volume 86, Issue 1, Pages 321-325Publisher
CANADIAN SCIENCE PUBLISHING, NRC RESEARCH PRESS
DOI: 10.1139/P07-161
Keywords
-
Categories
Ask authors/readers for more resources
In this report, a brief description of the current progress at the Shanghai EBIT project is presented. This is followed by a short discussion of the measurement of various parameters (electron beam diameter and ion density) under a number of operational conditions. A brief introduction to di-electronic recombination measurements for highly ionized xenon is given. Next, we present a preliminary measurement of the time dependence of xenon X-ray emission lines. Finally, a comparison of calculated and experimental charge-state distributions is given. This shows the influence of multi-electron capture and different distributions of the ion cloud on the charge state distribution.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available