3.9 Article Proceedings Paper

Recent advancements in Whole Powder Pattern Modelling

Journal

ZEITSCHRIFT FUR KRISTALLOGRAPHIE
Volume -, Issue -, Pages 101-111

Publisher

WALTER DE GRUYTER GMBH
DOI: 10.1524/zksu.2008.0014

Keywords

Line Profile Analysis; Whole Powder Pattern Modelling; dislocations; domain size distribution; powder diffraction

Ask authors/readers for more resources

Advantages of Whole Powder Pattern Modelling against conventional Lille Profile Analysis methods are briefly reviewed, and a specific example is discussed on the possible ambiguity in the interpretation of the Williamson-Hall plot for polydisperse systems. Advancements in WPPM concerning dislocation line broadening are illustrated with examples taken from the recent literature. Reliability and limits in the application of WPPM to nanocrystalline systems are also discussed.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

3.9
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available