Journal
ZEITSCHRIFT FUR KRISTALLOGRAPHIE
Volume -, Issue -, Pages 101-111Publisher
WALTER DE GRUYTER GMBH
DOI: 10.1524/zksu.2008.0014
Keywords
Line Profile Analysis; Whole Powder Pattern Modelling; dislocations; domain size distribution; powder diffraction
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Advantages of Whole Powder Pattern Modelling against conventional Lille Profile Analysis methods are briefly reviewed, and a specific example is discussed on the possible ambiguity in the interpretation of the Williamson-Hall plot for polydisperse systems. Advancements in WPPM concerning dislocation line broadening are illustrated with examples taken from the recent literature. Reliability and limits in the application of WPPM to nanocrystalline systems are also discussed.
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