Possibilities and limitations of X-ray diffraction using high-energy X-rays on a laboratory system

Analyzing powder diffraction data of nanocrystalline and amorphous materials using the pair distribution function method provides useful information about long and short range ordering in the material investigated. We have developed the application of PDF analysis on a standard laboratory system employing an X-ray tube with a silver anode as X-ray source. Meaningful results have been achieved from a range of samples that allowed for comparison with previously reported data, obtained using synchrotron radiation.