4.6 Article

InGaN-based thin film solar cells: Epitaxy, structural design, and photovoltaic properties

Journal

JOURNAL OF APPLIED PHYSICS
Volume 117, Issue 10, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4914908

Keywords

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Funding

  1. Japan Science and Technology Agency (JST-PRESTO)
  2. Japan Science and Technology Agency (JST-ALCA)
  3. Japanese Society for the Promotion of Science [24760285, 24760032]
  4. World Premier International Research Center (WPI) initiative on Materials Nanoarchitectonics (MANA), MEXT

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InxGa1-xN, with the tunable direct bandgaps from ultraviolet to near infrared region, offers a promising candidate for the high-efficiency next-generation thin-film photovoltaic applications. Although the adoption of thick InGaN film as the active region is desirable to obtain efficient light absorption and carrier collection compared to InGaN/GaN quantum wells structure, the understanding on the effect from structural design is still unclear due to the poor-quality InGaN films with thickness and difficulty of p-type doping. In this paper, we comprehensively investigate the effects from film epitaxy, doping, and device structural design on the performances of the InGaN-based solar cells. The high-quality InGaN thick film is obtained on AlN/sapphire template, and p-In0.08Ga0.92N is achieved with a high hole concentration of more than 10(18) cm(-3). The dependence of the photovoltaic performances on different structures, such as active regions and p-type regions is analyzed with respect to the carrier transport mechanism in the dark and under illumination. The strategy of improving the p-i interface by using a super-thin AlN interlayer is provided, which successfully enhances the performance of the solar cells. (C) 2015 AIP Publishing LLC.

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