4.0 Article

Bolus arrival time and its effect on tissue characterization with dynamic contrast-enhanced magnetic resonance imaging

Journal

JOURNAL OF MEDICAL IMAGING
Volume 3, Issue 1, Pages -

Publisher

SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
DOI: 10.1117/1.JMI.3.1.014503

Keywords

bolus arrival time; dynamic contrast-enhanced magnetic resonance imaging; Tofts model; pharmacokinetic analysis; reproducibly; quantitative imaging

Funding

  1. NCI NIH HHS [U24 CA180918, R01 CA111288, U01 CA151261] Funding Source: Medline
  2. NIBIB NIH HHS [P41 EB015902, P41 EB015898] Funding Source: Medline
  3. NATIONAL CANCER INSTITUTE [U01CA151261, U24CA180918, R01CA111288] Funding Source: NIH RePORTER
  4. NATIONAL INSTITUTE OF BIOMEDICAL IMAGING AND BIOENGINEERING [P41EB015902, P41EB015898] Funding Source: NIH RePORTER

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Matching the bolus arrival time (BAT) of the arterial input function (AIF) and tissue residue function (TRF) is necessary for accurate pharmacokinetic (PK) modeling of dynamic contrast-enhanced magnetic resonance imaging (DCE-MRI). We investigated the sensitivity of volume transfer constant (K-trans) and extravascular extracellular volume fraction (v(e)) to BAT and compared the results of four automatic BAT measurement methods in characterization of prostate and breast cancers. Variation in delay between AIF and TRF resulted in a monotonous change trend of Ktrans and ve values. The results of automatic BAT estimators for clinical data were all comparable except for one BAT estimation method. Our results indicate that inaccuracies in BAT measurement can lead to variability among DCE-MRI PK model parameters, diminish the quality of model fit, and produce fewer valid voxels in a region of interest. Although the selection of the BAT method did not affect the direction of change in the treatment assessment cohort, we suggest that BAT measurement methods must be used consistently in the course of longitudinal studies to control measurement variability. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)

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