4.5 Article

Origin of huge photoluminescence efficiency improvement in InGaN/GaN multiple quantum wells with low-temperature GaN cap layer grown in N-2/H-2 mixture gas

Journal

APPLIED PHYSICS EXPRESS
Volume 10, Issue 6, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.7567/APEX.10.061004

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Funding

  1. National Natural Science Foundation of China [61504090, 21471111, 61475110, 61404089]
  2. Applied Basic Research Projects of Shanxi Province [2016021028]
  3. Shanxi Provincial Key Innovative Research Team in Science and Technology [201605D131045-10]

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The nominal internal quantum efficiency of InGaN/GaN multiple quantum wells significantly increases from 5.6 to 26.8%, as a low-temperature GaN cap layer is grown in N-2/H-2 mixture gas. Meanwhile, the room-temperature photoluminescence (PL) peak energy shows a merely 73 meV blue shift. On the basis of temperature-dependent PL characteristics analysis, the huge improvement in PL efficiency arises mainly from the etching effect of hydrogen, which reduces the defect density and indium segregation at the upper well/barrier interface, and consequently contributes to the decrease in the number of nonradiative recombination centers and the enhancement of carrier localization. (C) 2017 The Japan Society of Applied Physics

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