Journal
SMALL METHODS
Volume 2, Issue 8, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/smtd.201700341
Keywords
lithium secondary batteries; SXRD; synchrotron; XAFS; X-ray microscopy
Funding
- Nature Sciences and Engineering Research Council of Canada (NSERC)
- Canada Research Chair Program
- Canada Foundation for Innovation (CFI)
- Ontario Research Fund
- Canada Light Source (CLS) at the University of Saskatchewan
- University of Western Ontario
- CFI
- NSERC
- NRC
- CHIR
- University of Saskatchewan
- U.S. DOE [DE-AC02-06CH11357]
Ask authors/readers for more resources
Owing to the recent advance of third-generation synchrotron radiation (SR) sources, SR-based X-ray techniques have been widely applied to study lithium-ion batteries, lithium-sulfur batteries, and lithium-oxygen batteries to solve material challenges. SR-based techniques provide high chemical and physical sensitivity and a comprehensive picture of material structure and reaction mechanisms. An in-depth understanding of batteries is imperative for the development of future energy storage devices with enhanced electrochemical performance to meet societies' growing need for devices with high energy density. Here, recent progress in the application of SR techniques for lithium secondary batteries with a focus on several techniques, including X-ray absorption fine structure, synchrotron X-ray diffraction, and synchrotron X-ray microscopy techniques is reviewed. The working principle for all characterization techniques is introduced to provide context for how the technique is used in the field of energy storage. Through discussing the utilization of SR techniques in different directions of batteries, including electrodes, electrolytes, and interfaces, the practical application strategies of techniques in batteries are clarified. By summarizing and discussing the application of SR techniques in batteries, the aim is to highlight the crucial role of SR characterization in the development of advanced energy materials.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available