Journal
IEEE ACCESS
Volume 7, Issue -, Pages 151754-151763Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/ACCESS.2019.2947510
Keywords
Leaf classification; few-shot learning; convolutional neural network; Siamese network
Categories
Funding
- Fundamental Research Funds for the Central Universities [2015ZCQ-GX-01]
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In recent years, the method of plant leaf classification by deep learning has gradually become mature. However, training a leaf classifier based on deep learning requires a large number of samples for supervised training. In this paper, a few-shot learning method based on the Siamese network framework is proposed to solve a leaf classification problem with a small sample size. First, the features of two different images are extracted by a parallel two-way convolutional neural network with weight sharing. Then, the network uses a loss function to learn the metric space, in which similar leaf samples are close to each other and different leaf samples are far away from each other. In addition, a spatial structure optimizer (SSO) method for constructing the metric space is proposed, which will help to improve the accuracy of leaf classification. Finally, a k-nearest neighbor (kNN) classifier is used to classify leaves in the learned metric space. The average classification accuracy is used as a performance measure. The open access Flavia, Swedish and Leafsnap datasets are used to evaluate the performance of the method. The experimental results show that the proposed method can achieve a high classification accuracy with a small size of supervised samples.
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