Journal
CHEMICAL COMMUNICATIONS
Volume 56, Issue 30, Pages 4204-4207Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/d0cc00119h
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Funding
- NSF CREST Center for Interface Design and Engineered Assembly of Low Dimensional systems (IDEALS) [HRD1547830]
- Air Force Office of Scientific Research [FA9550-19-1-0220, FA9550-18-1-0012]
- NSF CHE [CHE1610755]
- NSF [1531991]
- DOE Office of Science [DE-SC0012704]
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We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.
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