Journal
PHYSICAL REVIEW B
Volume 61, Issue 4, Pages 2991-2996Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.61.2991
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The atomic structure of a carbon nanotube can be described by its chiral angle and diameter and can be specified by a pair of lattice indices (n,m). The electronic and mechanical properties are critically dependent on these indices, Scanning tunneling microscopy (STM) is a useful tool to investigate carbon nanotubes since the atomic structure as well as the electronic properties of individual molecules can be determined. This paper presents a discussion of the technique to obtain (n,m) indices of nanotubes from STM images in combination with current-voltage tunnel spectra. image contrast, distortion effects, and determination of chiral angle and diameter are discussed. The procedure of(n,m) identification is demonstrated for a few single-walled carbon nanotubes.
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