Journal
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
Volume 195, Issue -, Pages 507-516Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S1387-3806(99)00171-2
Keywords
negative ions; dissociative attachment; desorption
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The formation of negative ions following low energy (0-14 eV) electron impact to CHF2Cl under different phase conditions is studied including isolated gas phase molecules, free homogeneous clusters, and multilayer CHF2Cl films condensed on a metallic substrate at cryogenic temperature. In the gas phase we observe three very weak resonances on the Cl-, F-, and H- dissociative attachment (DA) channels peaking near 1.1, 3.4, and approximate to 6 eV, respectively. From clusters, we find solvated fragment ions of the form Cl-.(CHF2Cl)(n) and F-.((CHFCl)-Cl-2)(n) but no parent anions or undissociated larger cluster ions. Electron impact to condensed CHF2Cl leads to remarkably strong resonance features in the desorption yield with peak maxima at 9.7 (Cl-, F-) and 5.5 eV (H-). The absolute cross section for ion desorption is about 2 orders of magnitude higher than the gas phase DA cross section. This observation is explained in terms of a particular medium enhanced DA reaction at the surface based on the conversion of a short lived open channel resonance into a longer lived (closed channel) Feshbach resonance. (C) 2000 Elsevier Science B.V.
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