Journal
ULTRAMICROSCOPY
Volume 82, Issue 1-4, Pages 85-95Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0304-3991(99)00154-0
Keywords
AFM; atomic force microscopy; unbinding; force spectroscopy
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The force-distance cycle mode of the atomic force microscope (AFM) allows for detection of interaction forces between the AFM-tip and a substrate (probe). This can either be a direct tip-sample interaction or an interaction between molecules coupled to the tip and probe, respectively. The interaction forces are typically in the range of a few pN to some hundred pN. In this article we describe algorithms for the analysis of force-distance cycles, to quantify interaction forces between tip and probe. Both, the direct tip-probe interaction as well as the interaction between specifically bound molecules are analyzed. The molecules bound to tip and probe have to be either long and flexible or have to be bound via a flexible cross linker. The algorithms are exemplified on direct tip-probe interactions and on unbinding events of cadherins which are bound via PEG-spacers to the AFM-tip and to the probe. (C) 2000 Elsevier Science B.V. All rights reserved.
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