Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 29, Issue 3, Pages 256-261Publisher
SPRINGER
DOI: 10.1007/s11664-000-0059-7
Keywords
GaN; plasma; damage; ICP; diodes
Ask authors/readers for more resources
The effect of Inductively Coupled Plasma H-2 or Ar discharges on the breakdown voltage of p-GaN diodes was measured over a range of ion energies and fluxes. The main effect of plasma exposure is a decrease in net acceptor concentration to depths of 400-550 Angstrom. At high ion fluxes or energies there can be type conversion of the initially p-GaN surface. Post etch annealing at 900 degrees C restores the initial conductivity.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available