Journal
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
Volume 10, Issue 1, Pages 1054-1057Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/77.828413
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Known expressions for the critical temperature, critical field and Pinning force in NbTi are combined into a self consistent fit formula that provides the critical current density as a function of temperature and field. The main advantage of such a fit is the extended validity range. Data available in literature and measurements on LHC strands are used to demonstrate the accuracy of the fit. The J(c) data-sets used to cover a range of field from 0 T to 9 T and temperature from 1.9 K to 9 K. The standard deviation of the fits presented is of the order of 5 % or better. This accuracy is generally sufficient for design purposes, extrapolation and scaling of measured results. Better accuracy, e.g. for short sample limit prediction, can be achieved restricting the domain of validity.
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