4.4 Article

Growth of platinum on TiO2- and SrO-terminated SrTiO3(100)

Journal

SURFACE SCIENCE
Volume 448, Issue 2-3, Pages 279-289

Publisher

ELSEVIER
DOI: 10.1016/S0039-6028(99)01233-9

Keywords

Auger electron spectroscopy; electron microscopy; molecular beam epitaxy; platinum; reflection high-energy electron diffraction (RHEED); single crystal surfaces

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Growth by molecular-beam epitaxy of platinum on TiO2-terminated and SrO-terminated (100) SrTiO3 (STO) single-crystal substrates was investigated. TiO2-terminated surfaces were produced by wet chemical etching and SrO-terminated surfaces by reactive molecular-beam epitaxy of SrO on TiO2-terminated substrates. Growth of both the platinum and SrO layers was monitored in vacuum by reflection high-energy electron diffraction and Auger electron spectroscopy, and the resulting films were characterized by X-ray diffraction, atomic force microscopy, and cross-sectional conventional and high-resolution transmission electron microscopies. The orientation of the platinum films was found to be strongly dependent on the surface termination: cube-on-cube Pt(100) was predominant for the TiO2-terminated surfaces, while the SrO-terminated showed a mixture of Pt(100) and Pt(111). The change in film orientation observed is attributed to a smaller degree of bonding across the interface for the SrO-terminated surface. (C) 2000 Elsevier Science B.V. All rights reserved.

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