Journal
APPLIED PHYSICS LETTERS
Volume 76, Issue 11, Pages 1425-1427Publisher
AMER INST PHYSICS
DOI: 10.1063/1.126052
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The increase in sheet resistance of indium-tin-oxide (ITO) films on polyethylene terephthalate with increasing tensile strain is reported. The increase in resistance is related to the number of cracks in the conducting layer which depends upon applied strain and film thickness. We propose a simple model that describes the finite but increasing resistance in the cracked ITO layer in terms of a small volume of conducting material within each crack. (C) 2000 American Institute of Physics. [S0003-6951(00)02710-8].
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