4.7 Article

Quantitative XPS analysis of silica-supported Cu-Co oxides

Journal

APPLIED SURFACE SCIENCE
Volume 157, Issue 3, Pages 159-166

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/S0169-4332(99)00568-1

Keywords

Cu-Co oxides; quantitative XPS analysis; XRD characterization

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Copper-cobalt oxides with Cu/Co = 5:5, 15:15 and 35:35 bulk ratio have been prepared by deposition-precipitation method at constant pH from copper and cobalt nitrate solutions. Different oxides were obtained by decomposition of the precursors at 673 K for 7 h in air and analyzed by X-ray diffraction (XRD), transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS). XRD data showed the formation of different oxide phases; for the bulk atomic ratio of 15Cu:15Co, a phase containing Cu and Co with spinel-like structure was observed, while the other bimetallic oxides presented CuO and Co3O4 as distinct phases. The XPS qualitative analysis has shown that all samples exhibited Cu2+ and Co3+ species at the surface. The Cu-Co spinel presented a displacement in Cu 2p binding energy value. A mathematical model was proposed from relative intensity ratios, which allowed the determination of the oxide particle thickness and the fraction of coverage at the support. This model described accurately the system and showed that cobalt improved the copper dispersion. (C) 2000 Elsevier Science B.V. All rights reserved.

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