Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 33, Issue -, Pages 401-405Publisher
MUNKSGAARD INT PUBL LTD
DOI: 10.1107/S0021889899013655
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A brief description is given of the C-program ROD with which surface structures can be refined on the basis of X-ray data. All main features one encounters on surfaces, like roughness, relaxations, reconstructions and multiple domains, are taken into account. The program has proven to be a useful tool over the past ten years. (C) 2000 International Union of Crystallography Printed in Great Britain - all rights reserved.
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