Journal
PHYSICAL REVIEW LETTERS
Volume 84, Issue 15, Pages 3398-3401Publisher
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.84.3398
Keywords
-
Categories
Ask authors/readers for more resources
We report measurements of nonequilibrium noise in a diffusive normal metal-superconductor (N-S) junction in the presence of both de bias and, high-frequency ac excitation. We find that the shot noise of a diffusive N-S junction is doubled compared to a normal diffusive conductor. Under ac excitation of frequency nu the shot noise develops features at bias voltages \ V \ = h nu/(2e), which bear all the hallmarks of a photon-assisted process. Observation of these features provides clear evidence that the effective charge of the current carriers is 2e, due to Andreev reflection.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available