4.6 Article

Electrical conductivity and thin-film growth dynamics

Journal

PHYSICAL REVIEW B
Volume 61, Issue 16, Pages 11109-11117

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.61.11109

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It is known that surface steps can give rise to diffusion barriers and generate moundlike rough surfaces during thin-him growth. We study the influence of moundlike rough surfaces on electron scattering and electrical conductivity of semiconducting and metallic thin films. For a semiconducting film, the intraminiband cutoff q(c) limits the contribution from mound surface scattering. Three different cases are illustrated to show how surface morphology affects the conductivity: q(0)q(c). Here go is the ring position of the surface power spectrum. For a metallic film with a single rough boundary, quantum size effect (QSE) oscillations are shifted in phase and weakened by the presence of wavelength selection in surface morphology. In this case, the conductivity reaches a minimum at a certain value of the system correlation length zeta when the mound separation lambda obeys the condition lambda>lambda(F) or lambda

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