Neutron reflectometry as a tool to study magnetism (invited)

Polarized-neutron specular reflectometry (PNR) was developed in the 1980's as a means of measuring magnetic depth profiles in flat films. Starting from simple profiles, and gradually solving structures of greater complexity, PNR has been used to observe or clarify a variety of magnetic phenomena. It has been used to measure the absolute magnetization of films of thickness not exceeding a few atomic planes, the penetration of magnetic fields in micron-thick superconductors, and the detailed magnetic coupling across nonmagnetic spacers in multilayers and superlattices. The development of new scattering techniques promises to enable the characterization of lateral magnetic structures. Retaining the depth sensitivity of specular reflectivity, off-specular reflectivity may be brought to resolve in-plane structures over nanometer to micron length scales. (C) 2000 American Institute of Physics. [S0021-8979(00)15508-2].