4.4 Article

Growth of RuO2 thin films by pulsed-laser deposition

Journal

THIN SOLID FILMS
Volume 366, Issue 1-2, Pages 102-106

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/S0040-6090(99)01111-6

Keywords

dielectrics; laser ablation; oxides; ruthenium

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We prepared RuO2 thin films on Si substrates by pulsed-laser deposition using a sintered oxide target, and investigated the crystallographic nature and the thermodynamic stability of the films in terms of the growth conditions: temperature and oxygen pressure. Faceted grains grew in a highly oxidizing atmosphere. The films grown at room temperature included a large quantity of oxygen ions in the Ru metal matrix. An oriented Ru metal film grew under a non-oxidizing atmosphere. The grain morphology was closely related to the oxygen pressure. (C) 2000 Elsevier Science S.A. All rights reserved.

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