Polarization dependence of resonant X-ray emission spectra in early transition metal compounds

We measure 2p --> 3d --> 2p resonant X-ray emission spectra (RXES) of d(0) system (ScF3 and TiO2) and analyze them by means of MX6 (M=Sc or Ti, X=F or O, respectively) cluster model with full multiplet effects. We treat the whole RXES process as a coherent second order optical process and take the polarization dependence into account. The strong polarization dependence of the inelastic peak is clearly seen both in the experimental and calculated results, In order to clarity it, we investigate the detailed mechanism of the polarization dependent RXES by the total energy level diagram and the group theoretical consideration.