4.6 Article

Modeling of 10-nm-scale ballistic MOSFET's

Journal

IEEE ELECTRON DEVICE LETTERS
Volume 21, Issue 5, Pages 242-244

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/55.841309

Keywords

ballistic transport; MOSFET's; numerical analysis; semiconductor device modeling; silicon on insulator; simulation; tunnel transistors; ultra-large-scale integration

Ask authors/readers for more resources

We have performed numerical modeling of nanoscale dual-gate ballistic n-MOSFET's with ultrathin undoped channel, taking into account the effects of quantum tunneling along the channel and through the gate oxide, The results show that transistors with channel length as small as 8 nm can exhibit either a transconductance up to 4000 mS/mm or gate modulation of current by more than 8 orders of magnitude, depending on the gate oxide thickness. These characteristics make the sub-10-nm devices potentially suitable for logic and memory applications, though their parameters are rather sensitive to size variations.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available